Special Issue Submission Closed

Advances in Sensors and Sensing Technology

01About This Special Issue

Sensors and Sensing Technology has been paid more and more attention by academia and industry because of its incomparable advantages, such as high sensitivity, fast response, and no contact. Various advanced sensors and measurement technologies are applied in more and more industrial scenes.
The primary goal of this special issue is to sensors and sensing technology. We invite contributions that explore sensors, with particular interest in photoelectric sensing technology.
Through this special issue, we aim to collect original research papers and reviews on recent developments of photoelectric measurement technologies and innovative applications. We welcome researchers from various disciplines to provide interdisciplinary perspectives on sensors and sensing technology. Your contributions will play a crucial role in advancing knowledge in this field.

Potential topics include, but are not limited to:

  1. Sensors and Sensing Technology
  2. Photoelectric Sensing
  3. Photoelectric sensors
  4. Image processing and pattern recognition
  5. Industrial Measurements
  6. Material Analysis
  7. Embedded System

02Meet the Guest Editors

Our distinguished editors bring deep subject-matter expertise to curate high-quality research and ensure a rigorous peer-review process.

Lead Guest Editor

Yusong Mu

Key Laboratory for Comprehensive Energy Saving of Cold Regions Architecture of Ministry of Education, Jilin Jianzhu University, Changhcun, China

Guest Editor

Jiahai Dai

Department of Computer Science and Technology, Changchun University of Science and Technology, Changchun, China

Guest Editor

Shan Jiang

Department of Computer Science and Technology, Changchun University of Science and Technology, Changchun, China

Guest Editor

Yang Zhou

Department of Information and Technology, Jilin Agricultural University, Changchun, China

Guest Editor

Yanjie Wang

Department of Electronic and Computer, Jilin Jianzhu University, Changchun, China

Guest Editor

Chunyan Xu

Institute for Interdisciplinary Quantum Information Technology, Jilin Engineering Normal University, Changchun, China

Guest Editor

Guangwei Sun

Department of Electronic and Computer, Jilin Jianzhu University, Changchun, China