Nonlinear and Negative Resistance in Loose Electrical Contacts Dark Bridge
American Journal of Physics and Applications
Volume 1, Issue 1, July 2013, Pages: 1-4
Received: May 2, 2013;
Published: Jun. 10, 2013
Views 3547 Downloads 165
Hiromichi Kubota, Graduate School of Health and Environment Sciences,Tohoku Bunka Gakuen University, Sendai, Japan
Shunsuke Sasaki, Graduate School of Health and Environment Sciences,Tohoku Bunka Gakuen University, Sendai, Japan
Hiroyuki Ishida, Graduate School of Health and Environment Sciences,Tohoku Bunka Gakuen University, Sendai, Japan
Tasuku Takagi, Graduate School of Health and Environment Sciences,Tohoku Bunka Gakuen University, Sendai, Japan
Follow on us
The dark bridge in loose electrical contacts was investigated, which grew up when the contact gap was increased a little with micron by micron. The dark bridge was watched by microscopic camera along with measurement of voltage-current (V-I) relationship. At very small gap (less than 19μm for iron (Fe) contacts but different from materials), the V-I characteristics were linear, which is normal, but more than the 20~30μm, the non-linear relationship appeared and finally the negative resistance was observed. Experimental growth of dark bridge was shown in case of Pd. The nonlinear and negative resistance phenomena were tested for Fe. The resistance was analyzed and showed that it goes to negative one after crossing zero from positive region.
Electrical Contacts, Dark Bridge, Nonlinear, Exponential, Negative Resistance
To cite this article
Nonlinear and Negative Resistance in Loose Electrical Contacts Dark Bridge, American Journal of Physics and Applications.
Vol. 1, No. 1,
2013, pp. 1-4.
Hiroyuki Ishida, Masanari Taniguchi, Tasuku Takagi, "Precise Measurement of Dark Bridge between Micro-gap Electrical Contacts in a State of Thermal Equilibrium Condition", Proc. of the IEEE IMTC 2005, Ottawa Canada May 2005.
Hiroyuki Ishida, Masanari Taniguchi, Hideaki Sone, Hiroshi Inoue, Tasuku Takagi, "Relationship between Length and Diameter of Contact Bridge Formed under Thermal Equliburium Condition", IEICE Transactions on Electronics, Vol. E88-C ,No.8, 2005
Hiromichi Kubota, Masanari Taniguchi, Shosuke Suzuki, Tasuku Takagi, "Contact Failure and Thermal Deformation Analysis of Printed Circuit Board Connector Due to Thermal Stress by Using Holography,", Proceedings of the ICEC2008 Saint-Malo-France, 2008
TAKAGI Tasuku, "Noise properties in breaking and loose contacts and their effect on quality degradation of digital signal", Journal of Zhenjiang University SCIENCE A 2007 8(3):357-360
R.Holm, Electric Contacts: theory and applications,p.11~16, Springer-Verlag, Berlin 2000