American Journal of Embedded Systems and Applications

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Examination of the Possibilities for Integrated Testing of Embedded Systems

Received: 25 July 2013    Accepted:     Published: 20 August 2013
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Abstract

Separate testing of hardware and software of embedded systems is insufficient. Communication between hardware and software parts needs to be tested during the integrated testing. Discussions about this problem are practically unavailable. Black-box criteria are used for hardware and software testing. This creates the conditions for formulating a unified test generation task and a single template for the generation of tests, as well as enabling a comparison between the criteria of test generation. Black-box criteria make it possible to start generating tests in the early design stages, once the initial software prototype is established. The test object is described in a finite state machine form. The availability of state variables enables the search for a compromise between test performance and quality in test generation. Experiments with two benchmarks showed which criterion of the black box approach is the most suitable for hardware and software testing and that the generation of integration tests according to two criteria is appropriate. The results are important for choosing a reasonable approach to embedded system integration testing.

DOI 10.11648/j.ajesa.20130101.11
Published in American Journal of Embedded Systems and Applications (Volume 1, Issue 1, September 2013)
Page(s) 1-12
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This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

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Copyright © The Author(s), 2024. Published by Science Publishing Group

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Keywords

mbedded Systems Testing, Hardware and Software Testing, General Testing Criteria

References
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Author Information
  • Kaunas University of Technology, Kaunas, Lithuania

  • Kaunas University of Technology, Kaunas, Lithuania

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  • APA Style

    Rimantas Seinauskas, Vytenis Seinauskas. (2013). Examination of the Possibilities for Integrated Testing of Embedded Systems. American Journal of Embedded Systems and Applications, 1(1), 1-12. https://doi.org/10.11648/j.ajesa.20130101.11

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    ACS Style

    Rimantas Seinauskas; Vytenis Seinauskas. Examination of the Possibilities for Integrated Testing of Embedded Systems. Am. J. Embed. Syst. Appl. 2013, 1(1), 1-12. doi: 10.11648/j.ajesa.20130101.11

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    AMA Style

    Rimantas Seinauskas, Vytenis Seinauskas. Examination of the Possibilities for Integrated Testing of Embedded Systems. Am J Embed Syst Appl. 2013;1(1):1-12. doi: 10.11648/j.ajesa.20130101.11

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  • @article{10.11648/j.ajesa.20130101.11,
      author = {Rimantas Seinauskas and Vytenis Seinauskas},
      title = {Examination of the Possibilities for Integrated Testing of Embedded Systems},
      journal = {American Journal of Embedded Systems and Applications},
      volume = {1},
      number = {1},
      pages = {1-12},
      doi = {10.11648/j.ajesa.20130101.11},
      url = {https://doi.org/10.11648/j.ajesa.20130101.11},
      eprint = {https://download.sciencepg.com/pdf/10.11648.j.ajesa.20130101.11},
      abstract = {Separate testing of hardware and software of embedded systems is insufficient. Communication between hardware and software parts needs to be tested during the integrated testing. Discussions about this problem are practically unavailable. Black-box criteria are used for hardware and software testing. This creates the conditions for formulating a unified test generation task and a single template for the generation of tests, as well as enabling a comparison between the criteria of test generation. Black-box criteria make it possible to start generating tests in the early design stages, once the initial software prototype is established. The test object is described in a finite state machine form. The availability of state variables enables the search for a compromise between test performance and quality in test generation. Experiments with two benchmarks showed which criterion of the black box approach is the most suitable for hardware and software testing and that the generation of integration tests according to two criteria is appropriate. The results are important for choosing a reasonable approach to embedded system integration testing.},
     year = {2013}
    }
    

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    AU  - Rimantas Seinauskas
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    AB  - Separate testing of hardware and software of embedded systems is insufficient. Communication between hardware and software parts needs to be tested during the integrated testing. Discussions about this problem are practically unavailable. Black-box criteria are used for hardware and software testing. This creates the conditions for formulating a unified test generation task and a single template for the generation of tests, as well as enabling a comparison between the criteria of test generation. Black-box criteria make it possible to start generating tests in the early design stages, once the initial software prototype is established. The test object is described in a finite state machine form. The availability of state variables enables the search for a compromise between test performance and quality in test generation. Experiments with two benchmarks showed which criterion of the black box approach is the most suitable for hardware and software testing and that the generation of integration tests according to two criteria is appropriate. The results are important for choosing a reasonable approach to embedded system integration testing.
    VL  - 1
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