Please enter verification code
Examination of the Possibilities for Integrated Testing of Embedded Systems
American Journal of Embedded Systems and Applications
Volume 1, Issue 1, September 2013, Pages: 1-12
Received: Jul. 25, 2013; Published: Aug. 20, 2013
Views 3621      Downloads 139
Rimantas Seinauskas, Kaunas University of Technology, Kaunas, Lithuania
Vytenis Seinauskas, Kaunas University of Technology, Kaunas, Lithuania
Article Tools
Follow on us
Separate testing of hardware and software of embedded systems is insufficient. Communication between hardware and software parts needs to be tested during the integrated testing. Discussions about this problem are practically unavailable. Black-box criteria are used for hardware and software testing. This creates the conditions for formulating a unified test generation task and a single template for the generation of tests, as well as enabling a comparison between the criteria of test generation. Black-box criteria make it possible to start generating tests in the early design stages, once the initial software prototype is established. The test object is described in a finite state machine form. The availability of state variables enables the search for a compromise between test performance and quality in test generation. Experiments with two benchmarks showed which criterion of the black box approach is the most suitable for hardware and software testing and that the generation of integration tests according to two criteria is appropriate. The results are important for choosing a reasonable approach to embedded system integration testing.
mbedded Systems Testing, Hardware and Software Testing, General Testing Criteria
To cite this article
Rimantas Seinauskas, Vytenis Seinauskas, Examination of the Possibilities for Integrated Testing of Embedded Systems, American Journal of Embedded Systems and Applications. Vol. 1, No. 1, 2013, pp. 1-12. doi: 10.11648/j.ajesa.20130101.11
K. H. Pries, J. M. Quigley, Testing Complex and Embedded Systems. CRC Press, Taylor Francis Group, 2011, p. 314
G. J. Myers, C. Sandler, T. Badgett, The art of software testing. 3rd ed. John Wiley & Sons, 2011, p.256
H. Zhu, P. Hall, J. May, "Software unit test coverage and adequacy," ACM Computing Surveys (CSUR), 1997, Vol. 29 Issue 4, pp. 366-427, DOI: 10.1145/267580.267590
H. Wunderlich, Models in hardware testing. Springer, 2010, p. 257
B. Broekman, E. Notenboom, Testing embedded software. Addison Wesley, p. 368
A. Fin, F. Fummi, M. Martignano, M. Signoretto," SystemC: A homogenous environment to test embedded systems," Ninth International Symposium on Hardware/Software Codesign (CODES), 2001.pp. 17-22, DOI:10.1109/HSC.2001.924644
F. Xin, I. G. Harris," Test generation for hardware-software co-validation using non-linear programming," Seventh High- Level Design Validation and Test Workshop, 2002, pp. 175-180, DOI:10.1109/HLDVT.2002.1224449
P. J. Schroeder, B. Korel," Black-box test reduction using input-output analysis," ACM SIGSOFT international symposium on Software testing and analysis, 2000, pp. 173 – 177.
H. Y. Ong, Z. Zamli," Development of interaction test suite generation strategy with input-output mapping supports," Scientific Research and Essays Vol. 6(16), 2011, pp. 3418-3430, DOI: 10.5897/SRE11.427
E. Bareisa, V. Jusas, K. Motiejunas, R. Seinauskas. Functional digital systems testing. Technologija, 2006, p. 281.
E. Bareisa, V. Jusas, K. Motiejunas, R. Seinauskas," Functional delay test generation based on software prototype," Microelectronics Reliability, Vol. 49, iss. 12, 2009, pp. 1578-1585, DOI: 10.1016/j.microrel.2009.06.050
E. Bareisa, V. Jusas, L. Motiejunas, R. Seinauskas," Generating functional delay fault tests for non-scan circuits," Information technology and control, Vol. 39 Iss. 2, 2010, pp. 100-107
T. Frühwirth," Theory and practice of constraint handling rules," The Journal of Logic Programming,"Volume 37, Issues 1–3, 1998, pp. 95–138, DOI:10.1016/S0743-1066(98)10005-5
M. W. Moskewicz, C. F. Madigan, Y. Zhao, L. Zhang, S. Malik," Chaff: Engineering an Efficient SAT Solver," In: Proceeding of the 38th Design Automation Conference , 2001, pp. 530-535
P. McMinn," Search-based software test data generation: a survey," Software Testing, Verification & Reliability, . Volume 14 Issue 2, 2004, pp. 105 – 156, DOI:10.1002/stvr.v14:2
J. King," Symbolic execution and program testing," Communications of the ACM, Vol. 19, issue 7, 1976, pp. 385-394
L. Wang, C. W. Wu, X. Wen, VLSI Test Principles and Architectures, Design for Testability. Academic Press, 2006, p. 808
F. Jianping, L. Bin, L. Minyan," A Framework for Embedded Software Testability Measurement," Information and Automation Communications in Computer and Information Science, Volume 86, 2011, pp. 105-111
S. Kansomkeat, W. Rivepiboon," An analysis technique to increase testability of object-oriented components," Software testing, verification and reliability, Volume 18, Issue 4, 2008, pp.193-219, 193–219 DOI: 10.1002/stvr.387
T. Yu, A. Sung, W. Srisa-an, G. Rothermel," Using property based oracles when testing embedded system applications," In Proceedings of the Fourth International Conference on Software Testing, Verification and Validation, 2011, pp. 100-109
C. Artho, D. Drusinksy, A. Goldberg, and others, " Experiments with test case generation and runtime analysis," In Proceedings of 10th international conference on Advances in theory and practice, 2003, pp. 87–108
J. Corbett, M. Dwyer, J. Hatcliff," Bandera: extracting finite-state models from java source code," In Proceedings of the 22nd international conference on Software engineering, 2000, pp. 439–448
J. Huo, A. Petrenko," Transition covering tests for systems with queues," Software testing, verification and reliability, Volume 19, Issue 1, 2009, Pages: 55–83, DOI: 10.1002/stvr.396
A. Simao, A. Petrenko, N. Yevtushenko," On reducing test length for FSMs with extra states," Software testing, verification and reliability, Volume 22, Issue 6, 2012, Pages: 435–454, DOI: 10.1002/stvr.452
Science Publishing Group
1 Rockefeller Plaza,
10th and 11th Floors,
New York, NY 10020
Tel: (001)347-983-5186