Determination of Rounded Edge Diffraction Loss for a Plateau Using Hacking Method
American Journal of Software Engineering and Applications
Volume 6, Issue 2, April 2017, Pages: 35-39
Received: Jan. 3, 2017; Accepted: Jan. 18, 2017; Published: Jun. 12, 2017
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Authors
Victor Akpaiya Udom, Department of Electrical/Electronic and Computer Engineering, University of Uyo, Uyo, Nigeria
Kalu Constance, Department of Electrical/Electronic and Computer Engineering, University of Uyo, Uyo, Nigeria
Asuquo Ifiok Okon, Department of Electrical/Electronic and Computer Engineering, University of Uyo, Uyo, Nigeria
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Abstract
In this paper, Hacking rounded edge diffraction loss method is used to determine the diffraction loss over a plateau in the path of microwave signal in the GSM frequency band, 800 MHz to 2100 MHz. The computation is based on the path profile with path length of 4996.243 m and a plateau in the signal path. The plateau has maximum elevation of 268.9 m and it occurred at a distance of 3557.8 m from the transmitter. The line of sight clearance height is 45.747499 m and occultation distance is 1538.759 m. At 800 MHz, the diffraction loss is 55.25 dB whereas at 2100 MHz the diffraction loss is 71.713 dB. The result is useful for GSM network planning.
Keywords
Rounded Edge Diffraction, Diffraction Loss, Elevation Profile, Diffraction Parameter, Knife Edge Diffraction, Hacking Rounded Edge Diffraction Method
To cite this article
Victor Akpaiya Udom, Kalu Constance, Asuquo Ifiok Okon, Determination of Rounded Edge Diffraction Loss for a Plateau Using Hacking Method, American Journal of Software Engineering and Applications. Vol. 6, No. 2, 2017, pp. 35-39. doi: 10.11648/j.ajsea.20170602.14
Copyright
Copyright © 2017 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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