The Effect of He-Ne and Diode Lasers on the Electrical Characteristics of Silicon Diode
American Journal of Optics and Photonics
Volume 6, Issue 1, March 2018, Pages: 8-13
Received: Oct. 30, 2017;
Accepted: Nov. 11, 2017;
Published: Jan. 18, 2018
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Yousif Hassan Alsheikh Abd Alraheim, Department of Applied Physics & Mathematics, Omdurman Ahlia University, Omdurman, Khartoum, Sudan
Zainab Abdulla Mohamed Taha, Department of Applied Physics & Mathematics, Omdurman Ahlia University, Omdurman, Khartoum, Sudan
Zainab Mohamed Taha, Department of Applied Physics & Mathematics, Omdurman Ahlia University, Omdurman, Khartoum, Sudan
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The effect of He-Ne (632.8 nm) and diode (650 nm) lasers on the electrical characteristics of silicon diode have been studied. The electrical characteristics of the diode were recorded before laser irradiations, then the diode is subjected to He-Ne laser for 5 and 10 minutes and then the diode electrical characteristics were recorded for each time of exposure and the same was done in the case of irradiation with diode laser. The electrical characteristics of the diode before and after laser irradiations were compared and thermal effect was noticed when compared the effect of lasers irradiation and the well known temperature effect on the electrical characteristics of the diode. It was found that the effect of the He-Ne (632.8 nm) and diode laser (650 nm) on the electrical characteristics of silicon diode at exposure time of 5 minutes were comparable but for 10 minutes of exposure the effect of He-Ne laser irradiation on the characteristics was different from that of diode laser and this is due to the fact that the two lasers has different properties.
He-Ne Laser, Diode Laser, Electrical Characteristics of Silicon Diode, Laser Modes of Interaction
To cite this article
Yousif Hassan Alsheikh Abd Alraheim,
Zainab Abdulla Mohamed Taha,
Zainab Mohamed Taha,
The Effect of He-Ne and Diode Lasers on the Electrical Characteristics of Silicon Diode, American Journal of Optics and Photonics.
Vol. 6, No. 1,
2018, pp. 8-13.
Copyright © 2018 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/
) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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