Orientation Dependence of Hardness and Reduced Modulus of Single Crystal Sapphire Surface Measured by Nanoindentation
International Journal of Materials Science and Applications
Volume 8, Issue 5, September 2019, Pages: 76-80
Received: Sep. 15, 2019;
Accepted: Sep. 26, 2019;
Published: Oct. 10, 2019
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Toshiro Okawa, Scienta Omicron, Inc., Tokyo, Japan; Materials & Surface Engineering Research Institute, Kanto Gakuin University, Kanagawa, Japan
Ian Thomas Clark, Seiko Epson Corporation, Nagano, Japan
Katsuhiko Tashiro, Materials & Surface Engineering Research Institute, Kanto Gakuin University, Kanagawa, Japan; Research Advancement and Management Organization, Kanto Gakuin University, Kanagawa, Japan
Hideo Honma, Materials & Surface Engineering Research Institute, Kanto Gakuin University, Kanagawa, Japan; Research Advancement and Management Organization, Kanto Gakuin University, Kanagawa, Japan
Kazuhiro Yoshihara, National Institute for Material Science, Ibaraki, Japan
Osamu Takai, Materials & Surface Engineering Research Institute, Kanto Gakuin University, Kanagawa, Japan; Research Advancement and Management Organization, Kanto Gakuin University, Kanagawa, Japan
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Nowadays, industrial products are downsized, and the structure of materials is controlled with the nanometer precision, and it becomes very important to measure the mechanical properties of local area of bulk material. Especially the hardness and the elastic modulus are important mechanical properties. The orientation dependence of hardness and reduced modulus of single crystal sapphire surface was investigated by nanoindentation. The conventional technique to measure the hardness of materials using an optical micrometer cannot evaluate mechanical properties of a local region of several µm or less. However, nanoindentation can measure mechanical properties of very small surface area of materials, and is expected to detect the micro structure dependence of mechanical properties. Nanoindentation uses very small indenter made of diamond, and measures the indentation depth. The measured depth is converted to the indented area size using the area function. The area function of the indenter can be obtained using a standard material (fused quartz) in advance. Therefore nanoindentation can measure the indented area size without using an optical micrometer. In this report, it was shown that the nanoindentation could detect the structure dependence of mechanical properties of materials. The specimen was a single crystal sapphire with c - axis surface, and the indenter was Berkovich type diamond tip. It was confirmed that the nanoindentation hardness was the lowest, and the reduced modulus was the largest, when the ridge line of indenter was oriented to the m - axis of single crystal. The nanoindentation could detect the structure dependence of a local area of mechanical properties materials.
Nanoindentation, Hardness, Elastic Modulus, Single Crystal, Sapphire
To cite this article
Ian Thomas Clark,
Orientation Dependence of Hardness and Reduced Modulus of Single Crystal Sapphire Surface Measured by Nanoindentation, International Journal of Materials Science and Applications.
Vol. 8, No. 5,
2019, pp. 76-80.
Copyright © 2019 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/
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W. C. Oliver and G. M. Pharr, J. Mater. Res., 7, 1564 (1992).
M. M. Khrushchov & E. S. Berkovich, Ind. Dia. Rev., 11, 42 (1951).
Hu Huang, Jiwang Yan and Scr. Mater., 102, 35 (2015).
Tama´s Csana´di, Marek Bl’anda, Nguyen Q. Chinh, Pavol Hvizdos and Ja´n Dusza., Acta Mater., 84, 397 (2015).
Hidetoshi Somekawa, Tomohito Tsuru, Alok Singh, Seiji Miura and Christopher A. Schuh., Acta Mater., 139, 21 (2017).
E. Renner, Y. Gaillard, F. Richard, F. Amiot and P. Delobelle., Int. J. Plasti., 77, 118 (2016).
Saurav Goel, Graham Cross, Alexander Stukowski, Ernst Gamsjäger, Ben Beake and Anupam Agrawal, Comput. Mater. Sci., 152, 196 (2018).
Ian N. Snedon, Int. J. Eng. Sci., 3, 47 (1965).
Anthony C. Fisher-Cripps, “Nanoindentation”, Springer., 257 (2011). 3.
M. R. VanLandingham, T. F. Juliano and M J Hagon, Meas. Sci. Technol., 16, 2173 (2005).
A. M. Minor, E. T. Lilleodden, E. A. Stachand J. W. Morris., J. Mater. Res., 19, 176 (2004).
Payel Maiti, Ammar Eqbal, Manjima Bhattacharya, Pradip Sekhar Das, Jiten Ghosh, Anoop Kumar Mukhopadhyay, Ceram. Int., 45 (7), 8204 (2019).
Johan E. Fischer, W. R. Compion, Nancy A. Jaeger and Daniel C. Harris., SPIE. 1326, 11 (1990).
Ningchang Wang, Feng Jiang, Xipeng Xu and Xizhao Lu., Crystals., 8 (1), 3 (2018).
F. A. Strobel, Naval Weapons Center Technical Publication 6539 (1985).